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Kee Sup Kim, Charles R. Kime. Partial scan flip-flop selection by use of empirical testability. J. Electronic Testing, 7(1-2):47-59, 1995. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Partial Scan by Use of Empirical TestabilityKee Sup Kim, Charles R. Kime. iccad 1990: 314-317 Partial Scan Using Reverse Direction Empirical TestabilityKee Sup Kim, Charles R. Kime. itc 1993: 498-506
The following publications are possibly variants of this publication: