A 0.63ps, 12b, synchronous cyclic TDC using a time adder for on-chip jitter measurement of a SoC in 28nm CMOS technology

Sung Jin Kim, Taeik Kim, Hojin Park. A 0.63ps, 12b, synchronous cyclic TDC using a time adder for on-chip jitter measurement of a SoC in 28nm CMOS technology. In Symposium on VLSI Circuits, VLSIC 2014, Digest of Technical Papers, Honolulu, HI, USA, June 10-13, 2014. pages 1-2, IEEE, 2014. [doi]

Abstract

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