Tae-Hyun Kim, Hyeonchan Lim, Minho Cheong, Hyojoon Yun, Sungho Kang. Logic Diagnosis Based on Deep Learning for Multiple Faults. In 19th International SoC Design Conference, ISOCC 2022, Gangneung-si, Republic of Korea, October 19-22, 2022. pages 366-367, IEEE, 2022. [doi]
@inproceedings{KimLCYK22,
title = {Logic Diagnosis Based on Deep Learning for Multiple Faults},
author = {Tae-Hyun Kim and Hyeonchan Lim and Minho Cheong and Hyojoon Yun and Sungho Kang},
year = {2022},
doi = {10.1109/ISOCC56007.2022.10031434},
url = {https://doi.org/10.1109/ISOCC56007.2022.10031434},
researchr = {https://researchr.org/publication/KimLCYK22},
cites = {0},
citedby = {0},
pages = {366-367},
booktitle = {19th International SoC Design Conference, ISOCC 2022, Gangneung-si, Republic of Korea, October 19-22, 2022},
publisher = {IEEE},
isbn = {978-1-6654-5971-6},
}