Tae-Hyun Kim, Hyeonchan Lim, Minho Cheong, Hyojoon Yun, Sungho Kang. Logic Diagnosis Based on Deep Learning for Multiple Faults. In 19th International SoC Design Conference, ISOCC 2022, Gangneung-si, Republic of Korea, October 19-22, 2022. pages 366-367, IEEE, 2022. [doi]
Abstract is missing.