Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS

Hyung-Ock Kim, Bong Hyun Lee, Jong-Tae Kim, Jung Yun Choi, Kyu-Myung Choi, Youngsoo Shin. Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS. IEEE Trans. VLSI Syst., 18(3):505-509, 2010. [doi]

Authors

Hyung-Ock Kim

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Bong Hyun Lee

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Jong-Tae Kim

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Jung Yun Choi

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Kyu-Myung Choi

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Youngsoo Shin

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