Hyung-Ock Kim, Bong Hyun Lee, Jong-Tae Kim, Jung Yun Choi, Kyu-Myung Choi, Youngsoo Shin. Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS. IEEE Trans. VLSI Syst., 18(3):505-509, 2010. [doi]
@article{KimLKCCS10,
title = {Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS},
author = {Hyung-Ock Kim and Bong Hyun Lee and Jong-Tae Kim and Jung Yun Choi and Kyu-Myung Choi and Youngsoo Shin},
year = {2010},
doi = {10.1109/TVLSI.2009.2012429},
url = {http://dx.doi.org/10.1109/TVLSI.2009.2012429},
researchr = {https://researchr.org/publication/KimLKCCS10},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {18},
number = {3},
pages = {505-509},
}