Dae-Hyun Kim, Linda Milor. Analysis of errors in estimating wearout characteristics of time-dependent dielectric breakdown using system-level accelerated life test. Microelectronics Reliability, 76:47-52, 2017. [doi]
@article{KimM17-10,
title = {Analysis of errors in estimating wearout characteristics of time-dependent dielectric breakdown using system-level accelerated life test},
author = {Dae-Hyun Kim and Linda Milor},
year = {2017},
doi = {10.1016/j.microrel.2017.06.039},
url = {https://doi.org/10.1016/j.microrel.2017.06.039},
researchr = {https://researchr.org/publication/KimM17-10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {47-52},
}