External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Analysis of errors in estimating wearout characteristics of time-dependent dielectric breakdown using system-level accelerated life test

Dae-Hyun Kim, Linda Milor. Analysis of errors in estimating wearout characteristics of time-dependent dielectric breakdown using system-level accelerated life test. Microelectronics Reliability, 76:47-52, 2017. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.

runs on