Jinsook Kim, Weiping Ni, Edwin C. Kan. Resistive Loss and Trans-Impedance Characterization of Nonlinear Transmission Lines on CMOS SOI Substrate. In Proceedings 2005 IEEE International SOC Conference, September 25-28, 2005, Washington Dulles Airport, Herndon, VA. pages 203-206, IEEE, 2005. [doi]
@inproceedings{KimNK05,
title = {Resistive Loss and Trans-Impedance Characterization of Nonlinear Transmission Lines on CMOS SOI Substrate},
author = {Jinsook Kim and Weiping Ni and Edwin C. Kan},
year = {2005},
doi = {10.1109/SOCC.2005.1554495},
url = {http://dx.doi.org/10.1109/SOCC.2005.1554495},
researchr = {https://researchr.org/publication/KimNK05},
cites = {0},
citedby = {0},
pages = {203-206},
booktitle = {Proceedings 2005 IEEE International SOC Conference, September 25-28, 2005, Washington Dulles Airport, Herndon, VA},
publisher = {IEEE},
isbn = {0-7803-9264-7},
}