Jinsook Kim, Weiping Ni, Edwin C. Kan. Resistive Loss and Trans-Impedance Characterization of Nonlinear Transmission Lines on CMOS SOI Substrate. In Proceedings 2005 IEEE International SOC Conference, September 25-28, 2005, Washington Dulles Airport, Herndon, VA. pages 203-206, IEEE, 2005. [doi]
Abstract is missing.