Mura Defect Detection on Compact Camera Module (CCM) Using Metric Learning - researchr publication

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Y. G. Kim, T. H. Park. Mura Defect Detection on Compact Camera Module (CCM) Using Metric Learning. In 16th IEEE International Conference on Automation Science and Engineering, CASE 2020, Hong Kong, August 20-21, 2020. pages 1263-1268, IEEE, 2020. [doi]

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