Seyoung Kim, Heechun Park, Jaeha Kim. Safety Verification of AMS Circuits with Piecewise-Linear System Reachability Analysis. In 18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021. pages 203-206, IEEE, 2021. [doi]
Abstract is missing.