CMOS Charge Pump With No Reversion Loss and Enhanced Drivability

Joung-Yeal Kim, Su-Jin Park, Kee-Won Kwon, Bai-Sun Kong, Joo-Sun Choi, Young-Hyun Jun. CMOS Charge Pump With No Reversion Loss and Enhanced Drivability. IEEE Trans. VLSI Syst., 22(6):1441-1445, 2014. [doi]

Abstract

Abstract is missing.