Youngmin Kim, Dusan Petranovic, Dennis Sylvester. Simple and Accurate Models for Capacitance Increment due to Metal Fill Insertion. In Proceedings of the 12th Conference on Asia South Pacific Design Automation, ASP-DAC 2007, Yokohama, Japan, January 23-26, 2007. pages 456-461, IEEE, 2007. [doi]
Abstract is missing.