Chris H. Kim, Kaushik Roy, Steven Hsu, Ram Krishnamurthy, Shekhar Borkar. A process variation compensating technique with an on-die leakage current sensor for nanometer scale dynamic circuits. IEEE Trans. VLSI Syst., 14(6):646-649, 2006. [doi]
@article{KimRHKB06,
title = {A process variation compensating technique with an on-die leakage current sensor for nanometer scale dynamic circuits},
author = {Chris H. Kim and Kaushik Roy and Steven Hsu and Ram Krishnamurthy and Shekhar Borkar},
year = {2006},
doi = {10.1109/TVLSI.2006.878226},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2006.878226},
researchr = {https://researchr.org/publication/KimRHKB06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {14},
number = {6},
pages = {646-649},
}