The following publications are possibly variants of this publication:
- Simultaneous Control of Subthreshold and Gate Leakage Current in Nanometer-Scale CMOS CircuitsYoungsoo Shin, Sewan Heo, Hyung-Ock Kim, Jung Yun Choi. aspdac 2007: 654-659 [doi]
- Supply Switching With Ground Collapse: Simultaneous Control of Subthreshold and Gate Leakage Current in Nanometer-Scale CMOS CircuitsYoungsoo Shin, Sewan Heo, Hyung-Ock Kim, Jung Yun Choi. tvlsi, 15(7):758-766, 2007. [doi]
- Leakage and Process Variation Effects in Current Testing on Future CMOS CircuitsAli Keshavarzi, James Tschanz, Siva Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins. dt, 19(5):36-43, 2002. [doi]