Myungsuk Kim, Youngsun Song, Myoungsoo Jung, Jihong Kim. SARO: A State-Aware Reliability Optimization Technique for High Density NAND Flash Memory. In Deming Chen, Houman Homayoun, Baris Taskin, editors, Proceedings of the 2018 on Great Lakes Symposium on VLSI, GLSVLSI 2018, Chicago, IL, USA, May 23-25, 2018. pages 255-260, ACM, 2018. [doi]
Abstract is missing.