Youbean Kim, DongSup Song, Kicheol Kim, Incheol Kim, Sungho Kang. TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 17-24, IEEE, 2006. [doi]
@inproceedings{KimSKKK06,
title = {TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure},
author = {Youbean Kim and DongSup Song and Kicheol Kim and Incheol Kim and Sungho Kang},
year = {2006},
doi = {10.1109/ATS.2006.260987},
url = {https://doi.org/10.1109/ATS.2006.260987},
researchr = {https://researchr.org/publication/KimSKKK06},
cites = {0},
citedby = {0},
pages = {17-24},
booktitle = {15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006},
publisher = {IEEE},
isbn = {0-7695-2628-4},
}