Youbean Kim, DongSup Song, Kicheol Kim, Incheol Kim, Sungho Kang. TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 17-24, IEEE, 2006. [doi]
Abstract is missing.