Heejin Kim, Hayeon Shin, Jiyoung Park, Youngtae Choi, Jongwoo Park. Statistical modeling and reliability prediction for transient luminance degradation of flexible OLEDs. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 3, IEEE, 2018. [doi]
Abstract is missing.