Young-Hee Kim, Jae-Yoon Sim, Hong June Park, Jae-Ik Doh, Kun-Woo Park, Hyun-Woong Chung, Jong-Hoon Oh, Choon-Sik Oh, Seung-Han Ahn. Analysis and prevention of DRAM latch-up during power-on. J. Solid-State Circuits, 32(1):79-85, 1997. [doi]
Abstract is missing.