ASIC Yield Estimation at Early Design Cycle - researchr publication authors

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Von-Kyoung Kim, Mick Tegethoff, Tom Chen. ASIC Yield Estimation at Early Design Cycle. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 590-594, IEEE Computer Society, 1996.

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