Von-Kyoung Kim, Mick Tegethoff, Tom Chen. ASIC Yield Estimation at Early Design Cycle. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 590-594, IEEE Computer Society, 1996.
@inproceedings{KimTC96,
title = {ASIC Yield Estimation at Early Design Cycle},
author = {Von-Kyoung Kim and Mick Tegethoff and Tom Chen},
year = {1996},
tags = {design},
researchr = {https://researchr.org/publication/KimTC96},
cites = {0},
citedby = {0},
pages = {590-594},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}