Byung-Su Kim, Hyo-Sig Won, Tae-Hee Han, Joon-Sung Yang. AFSEM: Advanced frequent subcircuit extraction method by graph mining approach for optimized cell library developments. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 662-665, IEEE, 2016. [doi]
Abstract is missing.