YongJoon Kim, Myung-Hoon Yang, Youngkyu Park, Daeyeal Lee, Sungho Kang. An Effective Test Pattern Generation for Testing Signal Integrity. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 279-286, IEEE, 2006. [doi]
Abstract is missing.