Opportunities and challenges: Ultra-low voltage digital IC design techniques

Tony T. Kim, Jun Zhou, Yong Lian. Opportunities and challenges: Ultra-low voltage digital IC design techniques. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]

Abstract

Abstract is missing.