In-system constrained-random stimuli generation for post-silicon validation

Adam B. Kinsman, Ho Fai Ko, Nicola Nicolici. In-system constrained-random stimuli generation for post-silicon validation. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.