Flexible ATE module with reconfigurable circuit and its application [to CMOS imager test] - researchr publication

researchr

You are not signed in
Sign in
Sign up

Tagashi Kitagaki. Flexible ATE module with reconfigurable circuit and its application [to CMOS imager test]. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 940-946, IEEE Computer Society, 1999.

Abstract is missing.

runs on WebDSL