Fabian Klass, Ashish Jain, Greg Hess, Brian Park. An All-Digital On-Chip Process-Control Monitor for Process-Variability Measurements. In 2008 IEEE International Solid-State Circuits Conference, ISSCC 2008, Digest of Technical Papers, San Francisco, CA, USA, February 3-7, 2008. pages 408-409, IEEE, 2008. [doi]
Abstract is missing.