Daniel J. Kleitman, Frank Thomson Leighton, Yuan Ma. On the Design of Reliable Boolean Circuits that Contain Partially Unreliable Gates. In 35th Annual Symposium on Foundations of Computer Science, 20-22 November 1994, Santa Fe, New Mexico, USA. pages 332-346, IEEE, 1994.
@inproceedings{KleitmanLM94, title = {On the Design of Reliable Boolean Circuits that Contain Partially Unreliable Gates}, author = {Daniel J. Kleitman and Frank Thomson Leighton and Yuan Ma}, year = {1994}, tags = {design}, researchr = {https://researchr.org/publication/KleitmanLM94}, cites = {0}, citedby = {0}, pages = {332-346}, booktitle = {35th Annual Symposium on Foundations of Computer Science, 20-22 November 1994, Santa Fe, New Mexico, USA}, publisher = {IEEE}, }