On the Design of Reliable Boolean Circuits that Contain Partially Unreliable Gates

Daniel J. Kleitman, Frank Thomson Leighton, Yuan Ma. On the Design of Reliable Boolean Circuits that Contain Partially Unreliable Gates. In 35th Annual Symposium on Foundations of Computer Science, 20-22 November 1994, Santa Fe, New Mexico, USA. pages 332-346, IEEE, 1994.

Abstract

Abstract is missing.