Machine Learning for Circuit Aging Estimation under Workload Dependency

Florian Klemme, Hussam Amrouch. Machine Learning for Circuit Aging Estimation under Workload Dependency. In IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021. pages 37-46, IEEE, 2021. [doi]

Authors

Florian Klemme

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Hussam Amrouch

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