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Florian Klemme, Hussam Amrouch. Machine Learning for Circuit Aging Estimation under Workload Dependency. In IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021. pages 37-46, IEEE, 2021. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload DependencyFlorian Klemme, Hussam Amrouch. tcasI, 69(5):2142-2155, 2022. [doi] Modeling and Predicting Transistor Aging Under Workload Dependency Using Machine LearningPaul R. Genssler, Hamza Errahmouni Barkam, Karthik Pandaram, Mohsen Imani, Hussam Amrouch. tcasI, 70(9):3699-3711, September 2023. [doi]
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