Robert H. Klenke, Lori M. Kaufman, James H. Aylor, Ronald Waxman, Padmini Narayan. Workstation Based Parallel Test Generation. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 419-428, IEEE Computer Society, 1993.
Abstract is missing.