Bendik Kleveland, Jeong Choi, Jeff Kumala, Pascal Adam, Patrick Chen, Rajesh Chopra, Antonio Cruz, Ronald B. David, Ashish Dixit, Sinan Doluca, Mark Hendrickson, Ben Lee, Ming Liu, Michael John Miller, Mike Morrison, Byeong Cheol Na, Jay Patel, Dipak K. Sikdar, Michael Sporer, Clement Szeto, Anju Tsao, Jianguang Wang, Daniel Yau, Wesley Yu. Early detection and repair of VRT and aging DRAM bits by margined in-field BIST. In Symposium on VLSI Circuits, VLSIC 2014, Digest of Technical Papers, Honolulu, HI, USA, June 10-13, 2014. pages 1-2, IEEE, 2014. [doi]
@inproceedings{KlevelandCKACCC14,
title = {Early detection and repair of VRT and aging DRAM bits by margined in-field BIST},
author = {Bendik Kleveland and Jeong Choi and Jeff Kumala and Pascal Adam and Patrick Chen and Rajesh Chopra and Antonio Cruz and Ronald B. David and Ashish Dixit and Sinan Doluca and Mark Hendrickson and Ben Lee and Ming Liu and Michael John Miller and Mike Morrison and Byeong Cheol Na and Jay Patel and Dipak K. Sikdar and Michael Sporer and Clement Szeto and Anju Tsao and Jianguang Wang and Daniel Yau and Wesley Yu},
year = {2014},
doi = {10.1109/VLSIC.2014.6858414},
url = {http://dx.doi.org/10.1109/VLSIC.2014.6858414},
researchr = {https://researchr.org/publication/KlevelandCKACCC14},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {Symposium on VLSI Circuits, VLSIC 2014, Digest of Technical Papers, Honolulu, HI, USA, June 10-13, 2014},
publisher = {IEEE},
isbn = {978-1-4799-3327-3},
}