Bendik Kleveland, Jeong Choi, Jeff Kumala, Pascal Adam, Patrick Chen, Rajesh Chopra, Antonio Cruz, Ronald B. David, Ashish Dixit, Sinan Doluca, Mark Hendrickson, Ben Lee, Ming Liu, Michael John Miller, Mike Morrison, Byeong Cheol Na, Jay Patel, Dipak K. Sikdar, Michael Sporer, Clement Szeto, Anju Tsao, Jianguang Wang, Daniel Yau, Wesley Yu. Early detection and repair of VRT and aging DRAM bits by margined in-field BIST. In Symposium on VLSI Circuits, VLSIC 2014, Digest of Technical Papers, Honolulu, HI, USA, June 10-13, 2014. pages 1-2, IEEE, 2014. [doi]