Donald Kline Jr., Stephen Longofono, Rami G. Melhem, Alex K. Jones. Predicting Single Event Effects in DRAM. In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.