Daniel R. Knebel, Pia Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika. Diagnosis and characterization of timing-related defects by time-dependent light emission. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 733-739, IEEE Computer Society, 1998. [doi]
Abstract is missing.