Ho Fai Ko, Nicola Nicolici. RTL Scan Design for Skewed-Load At-speed Test under Power Constraints. In 24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA. pages 237-242, IEEE, 2006. [doi]
@inproceedings{KoN06:1,
title = {RTL Scan Design for Skewed-Load At-speed Test under Power Constraints},
author = {Ho Fai Ko and Nicola Nicolici},
year = {2006},
url = {http://www.iccd-conference.org/proceedings/2006/paper_153.pdf},
tags = {testing, constraints, design},
researchr = {https://researchr.org/publication/KoN06%3A1},
cites = {0},
citedby = {0},
pages = {237-242},
booktitle = {24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA},
publisher = {IEEE},
}