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Ho Fai Ko, Nicola Nicolici. RTL Scan Design for Skewed-Load At-speed Test under Power Constraints. In 24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA. pages 237-242, IEEE, 2006. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Functional Scan Chain Design at RTL for Skewed-Load Delay Fault TestingHo Fai Ko, Nicola Nicolici. ats 2004: 454-459 [doi] Test Wrapper Design and Optimization Under Power Constraints for Embedded Cores With Multiple Clock DomainsQiang Xu, Nicola Nicolici, Krishnendu Chakrabarty. tcad, 26(8):1539-1547, 2007. [doi] Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application StrategyHo Fai Ko, Nicola Nicolici. et, 24(4):393-403, 2008. [doi]
The following publications are possibly variants of this publication: