Yohan Ko, Hwisoo So, Jinhyo Jung, Kyoungwoo Lee, Aviral Shrivastava. Comprehensive Failure Analysis against Soft Errors from Hardware and Software Perspectives. In 39th IEEE International Conference on Computer Design, ICCD 2021, Storrs, CT, USA, October 24-27, 2021. pages 204-207, IEEE, 2021. [doi]
Abstract is missing.