Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness - researchr publication authors

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Yusuke Kobayashi, Kuniyuki Kakushima, Parhat Ahmet, V. Ramgopal Rao, Kazuo Tsutsui, Hiroshi Iwai. Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness. Microelectronics Reliability, 50(3):332-337, 2010. [doi]

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