Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness

Yusuke Kobayashi, Kuniyuki Kakushima, Parhat Ahmet, V. Ramgopal Rao, Kazuo Tsutsui, Hiroshi Iwai. Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness. Microelectronics Reliability, 50(3):332-337, 2010. [doi]

Abstract

Abstract is missing.