Yusuke Kobayashi, Kuniyuki Kakushima, Parhat Ahmet, V. Ramgopal Rao, Kazuo Tsutsui, Hiroshi Iwai. Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness. Microelectronics Reliability, 50(3):332-337, 2010. [doi]
@article{KobayashiKARTI10,
title = {Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness},
author = {Yusuke Kobayashi and Kuniyuki Kakushima and Parhat Ahmet and V. Ramgopal Rao and Kazuo Tsutsui and Hiroshi Iwai},
year = {2010},
doi = {10.1016/j.microrel.2010.01.003},
url = {http://dx.doi.org/10.1016/j.microrel.2010.01.003},
tags = {analysis},
researchr = {https://researchr.org/publication/KobayashiKARTI10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {3},
pages = {332-337},
}