Kazutoshi Kobayashi, Hidetoshi Onodera. Best ways to use billions of devices on a chip - Error predictive, defect tolerant and error recovery designs. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 811-812, IEEE, 2008. [doi]
@inproceedings{KobayashiO08:1,
title = {Best ways to use billions of devices on a chip - Error predictive, defect tolerant and error recovery designs},
author = {Kazutoshi Kobayashi and Hidetoshi Onodera},
year = {2008},
doi = {10.1109/ASPDAC.2008.4484065},
url = {http://dx.doi.org/10.1109/ASPDAC.2008.4484065},
researchr = {https://researchr.org/publication/KobayashiO08%3A1},
cites = {0},
citedby = {0},
pages = {811-812},
booktitle = {Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008},
publisher = {IEEE},
}