Kazutoshi Kobayashi, Hidetoshi Onodera. Best ways to use billions of devices on a chip - Error predictive, defect tolerant and error recovery designs. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 811-812, IEEE, 2008. [doi]
Abstract is missing.