Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead - researchr publication authors

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Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich. Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 53-58, IEEE Computer Society, 2009. [doi]

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