Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead

Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich. Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 53-58, IEEE Computer Society, 2009. [doi]

@inproceedings{KochteZW09,
  title = {Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead},
  author = {Michael A. Kochte and Christian G. Zoellin and Hans-Joachim Wunderlich},
  year = {2009},
  doi = {10.1109/ETS.2009.26},
  url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2009.26},
  tags = {testing},
  researchr = {https://researchr.org/publication/KochteZW09},
  cites = {0},
  citedby = {0},
  pages = {53-58},
  booktitle = {14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009},
  publisher = {IEEE Computer Society},
  isbn = {978-0-7695-3703-0},
}