Thierry Kociniewski, Jeff Moussodji, Zoubir Khatir. Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions. Microelectronics Reliability, 55(3-4):547-551, 2015. [doi]
@article{KociniewskiMK15,
title = {Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions},
author = {Thierry Kociniewski and Jeff Moussodji and Zoubir Khatir},
year = {2015},
doi = {10.1016/j.microrel.2014.12.007},
url = {http://dx.doi.org/10.1016/j.microrel.2014.12.007},
researchr = {https://researchr.org/publication/KociniewskiMK15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {3-4},
pages = {547-551},
}