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Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions

Thierry Kociniewski, Jeff Moussodji, Zoubir Khatir. Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions. Microelectronics Reliability, 55(3-4):547-551, 2015. [doi]

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